A test instance for multilingual cataloging
Posted in eclectOpac on Jan 1st, 2009
guest editors, M. Munawar Chaudhri and Yong Yee Lim
Book, IOP Pub, 2008
Hardness · Testing · Nanotechnology · Chaudhri, M. Munawar · Lim, Yong Yee · International Indentation Workshop (3rd: 2007: Cavendish Laboratory, University of Cambridge, UK)
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